REFLECTRON RTF50
Reflectron RFT50 with electron impact ionisation, ion source mounted on flange opposite to the reflectron mounting flange, second detector with 20 kV post-acceleration behind the ion mirror.
RFT50 tof spectrometer with ion source for laser / electron impact ionisation |
Reflectron RFT50 with electron impact ionisation, ion source mounted on flange opposite to the reflectron mounting flange, second detector with 20 kV post-acceleration behind the ion mirror
Our Model RFT50 time-of-flight mass spectrometer is optimized for mass analysis of ions with mass > 100 000 amu. It uses a detector with 20 kV post-acceleration for efficient heavy-particle detection. The spectrometer can be equipped with different ion sources depending on the ionisation scheme employed:
- electron impact ionization of gas phase species
- laser ionisation, VUV ionisation,
- laser desorption and ablation from solid and liquid surfaces and small particles (aerosols, soot)
- sputtering of surfaces (SIMS)
Features:
- two-stage ion mirror
- large two-stage channelplate detector (40 mm diameter) with 20 kV post-acceleration for efficient heavy-particle dtection
- time resolution T/ΔT up to 10 000 (mass 130)
- electron impact ionisation with magnetically guided electron beam, sweep rate up to 10 kHz
- MS-Windows based software package for menu-driven spectrometer operation (electron impact ionisation)
- UHV-compatible setup, (O-ring sealed flanges on request)
Geometrical Data
- overall length ca. 950 mm
- (folded) field-free drift space ca. 1000 mm
- connection flange CF150 (8"CF o.d.) or CF100 (6"CF o.d.)
- flight tube (diameter 200 mm) with pump flange CF100 (6 "CF o.d.) and pressure gauge flange CF40 ( 2.75"CF o.d.)
- distance connection flange - ionisation zone from 100 to 300 mm
Options:
- mass analysis of negative ions
- detector with extended dynamic range to avoid detector saturation by intense mass peaks or high sweep rate
- three-stage mcp detector for low-signal mesurements
- additional detector behind the ion mirror
- parallel-wire ion gate to remove unwanted ionic species from the extracted ion beam, located in the Wiley-McLaren time focus of the two-stage ion source
Ion sources available:
for electron impact ionisation, laser ionisation, laser desorption and laser ablation, aerosol spectroscopy
Examples for RFT50 ion sources:
Ion source for electron impact ionisation, magnetically-guided electron beam |
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Ion source for cluster size analysis employing alternatively laser ionisation or electron impact ionisation |
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Ion source for laser ionisation of heavy clusters, travelling orthogonally to the tof axis |