REFLECTRON RTF50

Reflectron RFT50 with electron impact ionisation, ion source mounted on flange opposite to the reflectron mounting flange, second detector with 20 kV post-acceleration behind the ion mirror.

REFLECTRON RTF50
RFT50 tof spectrometer with ion source for laser / electron impact ionisation

Reflectron RFT50 with electron impact ionisation, ion source mounted on flange opposite to the reflectron mounting flange, second detector with 20 kV post-acceleration behind the ion mirror

Our Model RFT50 time-of-flight mass spectrometer is optimized for mass analysis of ions with mass > 100 000 amu. It uses a detector with 20 kV post-acceleration for efficient heavy-particle detection. The spectrometer can be equipped with different ion sources depending on the ionisation scheme employed:

  • electron impact ionization of gas phase species
  • laser ionisation, VUV ionisation,
  • laser desorption and ablation from solid and liquid surfaces and small particles (aerosols, soot)
  • sputtering of surfaces (SIMS)

REFLECTRON RTF50

Features:

  • two-stage ion mirror
  • large two-stage channelplate detector (40 mm diameter) with 20 kV post-acceleration for efficient heavy-particle dtection
  • time resolution T/ΔT up to 10 000 (mass 130)
  • electron impact ionisation with magnetically guided electron beam, sweep rate up to 10 kHz
  • MS-Windows based software package for menu-driven spectrometer operation (electron impact ionisation)
  • UHV-compatible setup, (O-ring sealed flanges on request)

Geometrical Data

  • overall length ca. 950 mm
  • (folded) field-free drift space ca. 1000 mm
  • connection flange CF150 (8"CF o.d.) or CF100 (6"CF o.d.)
  • flight tube (diameter 200 mm) with pump flange CF100 (6 "CF o.d.) and pressure gauge flange CF40 ( 2.75"CF o.d.)
  • distance connection flange - ionisation zone from 100 to 300 mm

Options:

  • mass analysis of negative ions
  • detector with extended dynamic range to avoid detector saturation by intense mass peaks or high sweep rate
  • three-stage mcp detector for low-signal mesurements
  • additional detector behind the ion mirror
  • parallel-wire ion gate to remove unwanted ionic species from the extracted ion beam, located in the Wiley-McLaren time focus of the two-stage ion source

Ion sources available:
for electron impact ionisation, laser ionisation, laser desorption and laser ablation, aerosol spectroscopy

Examples for RFT50 ion sources:

REFLECTRON RTF50 Ion source for electron impact ionisation, magnetically-guided 
electron beam
Ion source for cluster size analysis employing alternatively laser
ionisation or electron impact ionisation
REFLECTRON RTF50
REFLECTRON RTF50 Ion source for laser ionisation of heavy clusters, travelling orthogonally to the tof axis